Nanosystems Engineers
Tools and Technology
Tools Include:
- Laboratory safety furnaces (Ashing systems)
- Laboratory safety furnaces (Atmospheric furnaces)
- Atomic absorption AA spectrometers (Atomic absorption spectrometers)
- Scanning probe microscopes (Atomic force microscopes AFM)
- Semiconductor process systems (Atomic layer deposition ALD systems)
- Capacitance meters
- Capacitance meters (Capacitance-voltage C-V plotters)
- Tumblers or polishers (Chemical mechanical polishing CMP systems)
- Computer servers
- Scanning light or spinning disk or laser scanning microscopes (Confocal Raman microscopes)
- Semiconductor process systems (Contact mask aligners)
- Drying cabinets or ovens (Critical point dryers)
- Microtomes (Cryocut microtomes)
- Cryostats
- Desktop computers
- Binocular light compound microscopes (Differential interference contrast DIC microscopes)
- Semiconductor process systems (Downstream strippers)
- Laboratory evaporators (Electron beam evaporators)
- Semiconductor process systems (Electron beam lithography systems)
- Thickness measuring devices (Ellipsometers)
- Spectrometers (Energy dispersive x-ray EDX spectroscopes)
- Scanning electron microscopes (Field emission scanning electron microscopes FESEM)
- Laboratory evaporators (Filament evaporators)
- Binocular light compound microscopes (Fluorescence optical microscopes)
- Scanning electron microscopes (Focused ion beam scanning electron microscopes FIB-SEM)
- Impedance meters (Four-point probes)
- Fume hoods or cupboards (Fume hoods)
- Goniometers
- Microprocessors (Graphics processing units GPU)
- Handheld refractometers or polarimeters (Handheld refractometers)
- Semiconductor process systems (Image reversal ovens)
- Impedance meters (Impedance analyzers)
- Semiconductor process systems (Inductively coupled plasma reactive ion etchers ICP-RIE)
- Infrared spectrometers (Infrared microscopes)
- Inkjet printers
- Semiconductor process systems (Ion mills)
- Isolation glove boxes
- Tumblers or polishers (Lapping machines)
- Thermal differential analyzers (Laser flash systems)
- Signal generators (Laser pattern generators)
- Scanning light or spinning disk or laser scanning microscopes (Laser scanning confocal microscopes)
- Semiconductor process systems (Low pressure chemical vapor deposition LPCVD systems)
- Semiconductor process systems (Magnetron sputtering systems)
- Semiconductor process systems (Mask writers)
- Semiconductor process systems (Metal-organic chemical vapor deposition MOCVD systems)
- Semiconductor process systems (Molecular beam epitaxy MBE systems)
- Semiconductor process systems (Nanoimprint lithography NIL systems)
- Network analyzers
- Binocular light compound microscopes (Optical inspection microscopes)
- Signal generators (Optical pattern generators)
- Binocular light compound microscopes (Optical profilers)
- Laboratory safety furnaces (Oxidation furnaces)
- Semiconductor process systems (Oxide etchers)
- Optical diffraction apparatus (Particle size analyzers)
- Semiconductor process systems (Parylene deposition systems)
- Semiconductor process systems (Plasma cleaning systems)
- Semiconductor process systems (Plasma enhanced chemical vapor deposition PECVD systems)
- Potentiometers (Potentiostats)
- Electronic measuring probes (Probe stations)
- Surface testers (Profilometers)
- Lasers (Pulsed laser systems)
- Polarizing microscopes (Raman scattering microscopes)
- Spectrometers (Raman scattering spectroscopes)
- Temperature cycling chambers or thermal cyclers (Rapid thermal annealers RTA)
- Reciprocating shaking water baths (Reciprocating shaker water baths)
- Laboratory evaporators (Resistance evaporators)
- Scanning electron microscopes (Scanning auger microscopes)
- Scanning electron microscopes (Scanning electron microscopes SEM)
- Thickness measuring devices (Scanning ellipsometers)
- Scanning probe microscopes (Scanning tunneling microscopes STM)
- Spectrometers (Secondary ion mass spectrometers SIMS)
- Semiconductor testers (Semiconductor parameter analyzers)
- Spectrophotometers
- Thickness measuring devices (Spectroscopic ellipsometers)
- Drying cabinets or ovens (Spin dryers)
- Drying cabinets or ovens (Spin rinse dryers)
- Semiconductor process systems (Sputter coaters)
- Voltage or current meters (Surface charge analyzers)
- Surface testers (Surface profilers)
- Cryogenic temperature controllers (Temperature controllers)
- Laboratory evaporators (Thermal evaporators)
- Transmission electron microscopes (Transmission electron microscopes TEM)
- Lasers (Tunable lasers)
- Microtomes (Ultramicrotomes)
- Semiconductor process systems (Ultrasonic cutters)
- Infrared dryers (Ultraviolet UV exposure units)
- Vacuum ovens
- Video attachments for microscopes (Video microscopes)
- Semiconductor process systems (Wafer bond aligners)
- Semiconductor process systems (Wafer bonding systems)
- Semiconductor process systems (Wafer saws)
- Semiconductor process systems (Wafer spinners)
- Semiconductor process systems (Wire bonders)
- X ray diffraction equipment (X ray diffractometers)
- Spectrometers (X-ray photoelectron spectrometers)
- Light scattering equipment (Zeta potential analyzers)
Technologies Include:
- Analytical or scientific software
- CP2K
- CPMD
- CSC Elmer software
- Data acquisition software
- DL_POLY
- ESA MOSAICS
- Finite difference time domain FDTD software
- General Atomic and Molecular Electronic Structure System GAMESS
- LAMMPS Molecular Dynamics Simulator
- NWChem
- QuantumWise Atomistix ToolKit
- SEMC-2D
- Simulation software
- UTQUANT
- Vienna Ab-Initio Simulation Package VASP
- Computer aided design CAD software
- Autodesk AutoCAD software
- Breault Research ASAP
- Computer aided design CAD software
- Dassault Systemes SolidWorks software
- IMSI Design DesignCAD
- LinkCAD
- Optical Research Associates LightTools
- PTC Pro/ENGINEER software
- Tanner EDA L-Edit
- Computer aided manufacturing CAM software
- Rapid prototyping software
- Development environment software
- National Instruments LabVIEW
- Graphics or photo imaging software
- Adobe Systems Adobe Freehand
- Operating system software
- Linux software
- Presentation software
- Microsoft PowerPoint
- Spreadsheet software
- Microsoft Excel
- Word processing software
- Microsoft Word
The data sources for the information displayed here include: O*NET™. (Using onet291)
